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This is to inform you of a workshop for Elyra 7 with Lattice SIM,
newly developed lattice structured illumination-based super-resolution microscope system.
- In Lattice SIM, the sample area is illuminated with a lattice pattern instead of grid lines. The lattice pattern gives higher contrast and 2x higher sampling efficiency compared with conventional SIM, so that you need less illumination. This is a breakthrough
in light efficiency, enabling fast live imaging of 3D volumes at excellent resolutions (120 nm in XY and 300 nm in Z) while minimizing photodamage.
- Dr. Bernhard Zimmermann (Senior Director Business Sector Life Sciences, ZEISS Research Microscopy Solutions, Jena, Germany) is giving a seminar on Lattice SIM technology and its comparison to other super-resolution methods. After the seminar, we will have demonstration sessions using your own sample (about 2 hrs each).
Please register the seminar and the demonstration session (if you wish) by January 10 using the Registration URL below.
Date & Time
- Technical seminar: January 27 (Mon), 2020, 13:30-14:30
- Demonstration: January 27 (Mon), 2020, 1 session after the seminar
- January 28 (Tue), 2020, 3 sessions
- January 29 (Wed), 2020, 3 sessions
Venue
- Technical seminar: Room 119 of Research Bldg. No.1 (#32) at Main Campus of Kyoto University
- Demonstration: ZEISS-iCeMS Innovation Core, Room 305 of Research Bldg. No.1 Annex (#33)
You will have access to the system installed at ZEISS-iCeMS Innovation Core for several months. Please contact Takahiro Fujiwara (tfujiwara@icems.kyoto-u.ac.jp) if you get interested in long-term use of the system.
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